发明授权
- 专利标题: Multi charged particle beam writing apparatus and multi charged particle beam writing method
- 专利标题(中): 多带电粒子束写入装置和多带电粒子束写入方法
-
申请号: US13597699申请日: 2012-08-29
-
公开(公告)号: US08710467B2公开(公告)日: 2014-04-29
- 发明人: Ryoichi Yoshikawa , Munehiro Ogasawara
- 申请人: Ryoichi Yoshikawa , Munehiro Ogasawara
- 申请人地址: JP Numazu-shi
- 专利权人: NuFlare Technology, Inc.
- 当前专利权人: NuFlare Technology, Inc.
- 当前专利权人地址: JP Numazu-shi
- 代理机构: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- 优先权: JP2011-190957 20110901
- 主分类号: H01J37/302
- IPC分类号: H01J37/302
摘要:
In accordance with one aspect of this invention, a multi charged particle beam writing apparatus includes an aperture member, in which a plurality of openings are formed, configured to form multi-beams by making portions of the charged particle beam pass through the plurality of openings; a plurality of blankers configured to perform blanking-deflect regarding beams corresponding to the multi-beams; a writing processing control unit configured to control writing processing with a plurality of beams having passed through different openings among the plurality of openings being irradiated on the target object at a predetermined control grid interval; and a dose controlling unit configured to variably control a dose of a beam associated with deviation according to a deviation amount when an interval between the plurality of beams irradiated is deviated from the control grid interval.
公开/授权文献
信息查询