Invention Grant
- Patent Title: Polishing liquid
- Patent Title (中): 抛光液
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Application No.: US12036686Application Date: 2008-02-25
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Publication No.: US08715524B2Publication Date: 2014-05-06
- Inventor: Tetsuya Kamimura , Toshiyuki Saie , Masaru Yoshikawa
- Applicant: Tetsuya Kamimura , Toshiyuki Saie , Masaru Yoshikawa
- Applicant Address: JP Tokyo
- Assignee: FUJIFILM Corporation
- Current Assignee: FUJIFILM Corporation
- Current Assignee Address: JP Tokyo
- Agency: Sughrue Mion, PLLC
- Priority: JP2007-046207 20070226
- Main IPC: C09K13/00
- IPC: C09K13/00 ; H01L21/302

Abstract:
The invention provides a polishing liquid for polishing a barrier layer of a semiconductor integrated circuit, the polishing liquid comprising: a diquaternary ammonium cation; a corrosion inhibiting agent; and a colloidal silica, wherein the pH of the polishing liquid is in the range of 2.5 to 5.0. According to the invention, a polishing liquid capable of achieving a superior barrier layer polishing rate, as well as suppressing the occurrence of scratching due to the agglomeration of solid abrasive grains can be provided.
Public/Granted literature
- US20080203354A1 POLISHING LIQUID Public/Granted day:2008-08-28
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