Invention Grant
US08719665B2 Programming error correction code into a solid state memory device with varying bits per cell
有权
将错误纠正码编程成固态存储器件,每个单元具有不同位数
- Patent Title: Programming error correction code into a solid state memory device with varying bits per cell
- Patent Title (中): 将错误纠正码编程成固态存储器件,每个单元具有不同位数
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Application No.: US14056031Application Date: 2013-10-17
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Publication No.: US08719665B2Publication Date: 2014-05-06
- Inventor: Frankie F. Roohparvar , Vishal Sarin , Jung S. Hoei
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Leffert Jay & Polglaze, P.A.
- Main IPC: G11C29/00
- IPC: G11C29/00 ; H03M13/00 ; G06F11/00 ; G11C5/14

Abstract:
Memory devices that, in a particular embodiment, receive and transmit analog data signals representative of bit patterns of two or more bits such as to facilitate increases in data transfer rates relative to devices communicating data signals indicative of individual bits. Programming error correction code (ECC) and metadata into such memory devices includes storing the ECC and metadata at different bit levels per cell based on an actual error rate of the cells. The ECC and metadata can be stored with the data block at a different bit level than the data block. If the area of memory in which the block of data is stored does not support the desired reliability for the ECC and metadata at a particular bit level, the ECC and metadata can be stored in other areas of the memory array at different bit levels.
Public/Granted literature
- US20140053033A1 PROGRAMMING ERROR CORRECTION CODE INTO A SOLID STATE MEMORY DEVICE WITH VARYING BITS PER CELL Public/Granted day:2014-02-20
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