发明授权
- 专利标题: Plasma cleaning apparatus and method
- 专利标题(中): 等离子体清洗装置及方法
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申请号: US12582905申请日: 2009-10-21
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公开(公告)号: US08721796B2公开(公告)日: 2014-05-13
- 发明人: Martin Deehan , Matt Cheng-Hsiung Tsai , Nan Lu , David T. Or , Mei Chang
- 申请人: Martin Deehan , Matt Cheng-Hsiung Tsai , Nan Lu , David T. Or , Mei Chang
- 申请人地址: US CA Santa Clara
- 专利权人: Applied Materials, Inc.
- 当前专利权人: Applied Materials, Inc.
- 当前专利权人地址: US CA Santa Clara
- 代理机构: Patterson & Sheridan, LLP
- 主分类号: B08B6/00
- IPC分类号: B08B6/00
摘要:
Embodiments of the present invention generally include an apparatus for plasma cleaning and a method for plasma cleaning. The apparatus can include a lid body having a first surface for facing a pedestal during cleaning and a second surface opposite the first surface and substantially parallel to the first surface, the second surface having a first indentation sized to receive a magnet assembly, one or more handles coupled to the second surface of the lid body, and the magnet assembly resting in the first indentation. The method can include removing a sputtering target from the processing chamber, sealing the processing chamber, introducing a gas into the processing chamber, applying an RF bias to a pedestal within the processing chamber, maintaining the pedestal at a substantially constant temperature, and removing material from the pedestal to clean the pedestal.
公开/授权文献
- US20100101602A1 PLASMA CLEANING APPARATUS AND METHOD 公开/授权日:2010-04-29
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