Invention Grant
- Patent Title: Capacitor forming methods
- Patent Title (中): 电容器形成方法
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Application No.: US13753135Application Date: 2013-01-29
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Publication No.: US08734656B2Publication Date: 2014-05-27
- Inventor: Mark Kiehlbauch
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Wells St. John, P.S.
- Main IPC: H01G13/00
- IPC: H01G13/00

Abstract:
A capacitor forming method includes forming an electrically conductive support material over a substrate, forming an opening through at least the support material to the substrate, and, after forming the opening, forming a capacitor structure contacting the substrate and the support material in the opening. The support material contains at least 25 at % carbon. Another capacitor forming method includes forming a support material over a substrate, forming an opening through at least the support material to the substrate, and, after forming the opening, forming a capacitor structure contacting the substrate and the support material in the opening. The support material contains at least 20 at % carbon. The support material has a thickness and the opening has an aspect ratio 20:1 or greater within the thickness of the support material.
Public/Granted literature
- US20130140271A1 Capacitor Forming Methods Public/Granted day:2013-06-06
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