Invention Grant
US08736050B2 Front side copper post joint structure for temporary bond in TSV application 有权
前端铜柱接头结构,用于TSV应用中的临时粘结

Front side copper post joint structure for temporary bond in TSV application
Abstract:
An integrated circuit structure includes a semiconductor substrate; a conductive via (TSV) passing through the semiconductor substrate; and a copper-containing post overlying the semiconductor substrate and electrically connected to the conductive via.
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