Invention Grant
- Patent Title: System and method for multiple simultaneous automated defect detection
- Patent Title (中): 多个同时自动缺陷检测的系统和方法
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Application No.: US13288617Application Date: 2011-11-03
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Publication No.: US08744166B2Publication Date: 2014-06-03
- Inventor: Paul Raymond Scheid , Richard C. Grant , Alan Matthew Finn , Hongcheng Wang , Ziyou Xiong
- Applicant: Paul Raymond Scheid , Richard C. Grant , Alan Matthew Finn , Hongcheng Wang , Ziyou Xiong
- Applicant Address: US CT Hartford
- Assignee: United Technologies Corporation
- Current Assignee: United Technologies Corporation
- Current Assignee Address: US CT Hartford
- Agency: Miller, Matthias & Hull LLP
- Main IPC: G06K9/00
- IPC: G06K9/00

Abstract:
A system and method for performing automated defect detection using multiple image capture devices is disclosed. The system and method may include providing a plurality of image capture devices, the plurality of image capture devices capturing and transmitting a plurality of images of an object. The system and method may further include determining a feature correspondence between the plurality of images of the plurality of image capture devices, creating mosaiced images of the plurality of images if the feature correspondence is found or known and performing at least of an automated analysis and a manual inspection on the mosaiced images to find any defects in the object.
Public/Granted literature
- US20130113916A1 System and Method for Multiple Simultaneous Automated Defect Detection Public/Granted day:2013-05-09
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