发明授权
US08747689B2 Liquid processing method, liquid processing apparatus and storage medium
有权
液体处理方法,液体处理装置和储存介质
- 专利标题: Liquid processing method, liquid processing apparatus and storage medium
- 专利标题(中): 液体处理方法,液体处理装置和储存介质
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申请号: US13355709申请日: 2012-01-23
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公开(公告)号: US08747689B2公开(公告)日: 2014-06-10
- 发明人: Hiroki Ohno , Takehiko Orii
- 申请人: Hiroki Ohno , Takehiko Orii
- 申请人地址: JP Tokyo
- 专利权人: Tokyo Electron Limited
- 当前专利权人: Tokyo Electron Limited
- 当前专利权人地址: JP Tokyo
- 代理机构: Pearne & Gordon LLP
- 优先权: JP2011-013473 20110125
- 主分类号: B44C1/22
- IPC分类号: B44C1/22
摘要:
There are provided a liquid processing method and a liquid processing apparatus capable of providing a high etching rate and a high etching selectivity for silicon nitride against silicon oxide, and a storage medium storing the method thereon. In the method for etching, by an etching solution, a substrate on which silicon nitride and silicon oxide are exposed, the etching solution is produced by mixing a fluorine ion source material, water and a boiling point adjusting agent; the produced etching solution is heated to a substrate processing temperature equal to or higher than 140° C.; after a temperature of the etching solution reaches the substrate processing temperature, the temperature of the etching solution is maintained at the substrate processing temperature for a first preset time; and after a lapse of the first preset time, the substrate is etched by the etching solution maintained at the substrate processing temperature.
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