发明授权
- 专利标题: System and method for analyzing pore sizes of substrates
- 专利标题(中): 用于分析底物孔径的系统和方法
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申请号: US13817016申请日: 2011-09-26
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公开(公告)号: US08749783B2公开(公告)日: 2014-06-10
- 发明人: Stewart P. Wood , Charles F. Broomall
- 申请人: Stewart P. Wood , Charles F. Broomall
- 申请人地址: US MI Midland
- 专利权人: Dow Global Technologies LLC
- 当前专利权人: Dow Global Technologies LLC
- 当前专利权人地址: US MI Midland
- 国际申请: PCT/US2011/053226 WO 20110926
- 国际公布: WO2012/044570 WO 20120405
- 主分类号: G01N21/00
- IPC分类号: G01N21/00 ; G01N21/53 ; G01N21/954
摘要:
A system for analyzing the pore size of a substrate or device containing substrates adapted to separate fluids and has at least two surfaces, a first and a second surface, which are isolated from, one another and wherein the substrate or devices containing the substrates have an exit for fluids passing through the substrate, comprising: a) a particle generator (15) capable of generating particles of a controlled size; b) a system (18) for creating a pressure differential between the first and the second surface of the substrate; c) a light source (24) spaced front the exit of the substrate or device containing the substrate adapted for illuminating particles exiting the exit of the substrate or device containing the substrate; d) a closed flow path from the particle generator to the first surface of the substrate; e) a substrate or device holder (11) adapted for holding the substrate or device in the proper location in the system; and f) one or more reference images. Also described are methods of utilizing the system to identify pore sizes of substrates.
公开/授权文献
- US20130141722A1 SYSTEM AND METHOD FOR ANALYZING PORE SIZES OF SUBSTRATES 公开/授权日:2013-06-06
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