发明授权
- 专利标题： Spectral method for determining the source of expanded vermiculite insulation in attics and walls
- 专利标题（中）： 用于确定阁楼和墙壁中膨胀蛭石绝缘源的光谱法
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申请号： US13247682申请日： 2011-09-28
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公开(公告)号： US08751169B1公开(公告)日： 2014-06-10
- 发明人: Gregg A. Swayze , Heather A. Lowers , Roger N. Clark
- 申请人： Gregg A. Swayze , Heather A. Lowers , Roger N. Clark
- 申请人地址： US DC Washington
- 专利权人： The United States of America, as represented by the Secretary of the Department of the Interior
- 当前专利权人： The United States of America, as represented by the Secretary of the Department of the Interior
- 当前专利权人地址： US DC Washington
- 代理商 C. Joan Gilsdorf
- 主分类号： G01N31/00
- IPC分类号： G01N31/00 ; C04B14/20 ; C04B14/38
摘要：
A method for identifying the source of vermiculite insulation in situ using a portable spectrometer with a light-emitting contact probe and a personal computer. Identification is accomplished using NIR reflectance spectroscopy and absorption band depth ratios to differentiate between vermiculite sources and to test for the presence of amphibole, talc, or serpentine contaminants in vermiculite insulation.
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