发明授权
US08759792B2 Non-contact total emission detection method and system for multi-photon microscopy
有权
非接触式全发射检测方法及多光子显微镜系统
- 专利标题： Non-contact total emission detection method and system for multi-photon microscopy
- 专利标题（中）： 非接触式全发射检测方法及多光子显微镜系统
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申请号： US13383248申请日： 2010-07-12
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公开(公告)号： US08759792B2公开(公告)日： 2014-06-24
- 发明人: Jay R. Knutson , Christian A. Combs , Robert S. Balaban
- 申请人： Jay R. Knutson , Christian A. Combs , Robert S. Balaban
- 申请人地址： US DC Washington
- 专利权人： The United States of America, as Represented by the Secretary, Dept. of Health and Human Services
- 当前专利权人： The United States of America, as Represented by the Secretary, Dept. of Health and Human Services
- 当前专利权人地址： US DC Washington
- 代理机构： Polsinelli PC
- 代理商 Teddy C. Scott, Jr.; Ron Galant
- 国际申请： PCT/US2010/041723 WO 20100712
- 国际公布： WO2011/006162 WO 20110113
- 主分类号： H01J65/08
- IPC分类号： H01J65/08
摘要：
A multi-photon microscope having an illumination source that transmits an illumination light into a housing having an objective lens arrangement for illuminating a sample disposed outside the housing and directing a first portion of emission light emitted from the sample to a detection system is disclosed. A light collection system is disposed proximate the objective lens arrangement for directing a second portion of emission light in a coaxial relationship with the first portion of emission light to the detection system such that substantially all of the emission light on, around and above the illumination region is detected.
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