Invention Grant
US08766422B2 Through hole via filling using electroless plating 有权
通孔采用化学镀填充

Through hole via filling using electroless plating
Abstract:
An embedded wafer level ball grid array (eWLB) is formed by embedding a semiconductor die in a molding compound. A trench is formed in the molding compound with a laser drill. A first layer of copper is deposited on the sidewall of the trench by physical vapor deposition. A second layer of copper is then formed on the first layer of copper by an electroless process. A third layer of copper is then formed on the second layer by electroplating.
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