发明授权
- 专利标题: Particle analyzing apparatus and particle imaging method
- 专利标题(中): 粒子分析仪和粒子成像方法
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申请号: US12951779申请日: 2010-11-22
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公开(公告)号: US08772738B2公开(公告)日: 2014-07-08
- 发明人: Masatsugu Ozasa , Hiroyuki Kobayashi
- 申请人: Masatsugu Ozasa , Hiroyuki Kobayashi
- 申请人地址: JP
- 专利权人: Sysmex Corporation
- 当前专利权人: Sysmex Corporation
- 当前专利权人地址: JP
- 代理机构: Brinks Gilson & Lione
- 优先权: JP2009-272974 20091130; JP2010-198593 20100906
- 主分类号: G01N21/64
- IPC分类号: G01N21/64 ; G01N15/14 ; G01N15/00 ; G01N1/31
摘要:
A particle analyzing apparatus, comprising: a flow cell which forms a specimen flow including particles; first and second light sources; an irradiation optical system which applies lights emitted from the first and second light sources so that the lights are applied to the specimen flow; a detector which detects forward scattered light, the forward scattered light being emitted from the first light and scattered by the particle in the specimen flow, and generates a signal according to the detected scattered light; a light blocking member disposed between the flow cell and the detector; a controller which obtains characteristic parameters of the particle based on the signal from the detector; and an imaging device which captures an image of the particle in the specimen flow using the light from the second light source is disclosed. Particle imaging method is also disclosed.
公开/授权文献
- US20110127444A1 PARTICLE ANALYZING APPARATUS AND PARTICLE IMAGING METHOD 公开/授权日:2011-06-02
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