Invention Grant
- Patent Title: Wafer level package and methods of fabricating the same
- Patent Title (中): 晶圆级封装及其制造方法
-
Application No.: US13037159Application Date: 2011-02-28
-
Publication No.: US08779576B2Publication Date: 2014-07-15
- Inventor: Sang-wook Park , Nam-seog Kim , Seung-duk Baek
- Applicant: Sang-wook Park , Nam-seog Kim , Seung-duk Baek
- Applicant Address: KR
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR
- Agency: Renaissance IP Law Group LLP
- Priority: KR10-2010-0043052 20100507
- Main IPC: H01L23/48
- IPC: H01L23/48 ; H01L23/00 ; H01L23/31

Abstract:
In one embodiment, a wafer level package includes a rerouting pattern formed on a semiconductor substrate and a first encapsulant pattern overlying the rerouting pattern. The first encapsulant pattern has a via hole to expose a portion of the rerouting pattern. The package additionally includes an external connection terminal formed on the exposed portion of the rerouting pattern. An upper section of the sidewall and a sidewall of the external connection terminal may be separated by a gap distance. The gap distance may increase toward an upper surface of the encapsulant pattern.
Public/Granted literature
- US20110272819A1 WAFER LEVEL PACKAGE AND METHODS OF FABRICATING THE SAME Public/Granted day:2011-11-10
Information query
IPC分类: