Invention Grant
- Patent Title: Diagnostic system and method for a thermistor amplifier circuit
- Patent Title (中): 热敏电阻放大器电路的诊断系统和方法
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Application No.: US13008571Application Date: 2011-01-18
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Publication No.: US08788233B2Publication Date: 2014-07-22
- Inventor: Nataniel Barbosa Vicente , Todd Elliott Greenwood , Craig Benjamin Williams
- Applicant: Nataniel Barbosa Vicente , Todd Elliott Greenwood , Craig Benjamin Williams
- Applicant Address: US NY Schenectady
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Schenectady
- Agency: Cantor Colburn LLP
- Main IPC: G06F19/00
- IPC: G06F19/00

Abstract:
A diagnostic system and a diagnostic method for a thermistor amplifier circuit are provided. The system includes a transistor electrically coupled to a controllable variable resistor having a predetermined resistance. The transistor applies a test voltage signal to the circuit indicative of a first temperature value. An amplitude of the test voltage value is indicative of a simulated thermistor temperature value. The microprocessor determines a test temperature value based on the amplitude of an output voltage of the circuit. The microprocessor also determines an inaccuracy value based on the test temperature value and the simulated thermistor temperature value.
Public/Granted literature
- US20120185196A1 DIAGNOSTIC SYSTEM AND METHOD FOR A THERMISTOR AMPLIFIER CIRCUIT Public/Granted day:2012-07-19
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