Invention Grant
- Patent Title: Method for checking die seal ring on layout and computer system
- Patent Title (中): 在布局和计算机系统上检查密封圈的方法
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Application No.: US13951095Application Date: 2013-07-25
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Publication No.: US08788980B2Publication Date: 2014-07-22
- Inventor: Jui-Yun Chang , Jian-Cheng Chen , I-Jen Kao , Chih-Wei Hsu
- Applicant: United Microelectronics Corp.
- Applicant Address: TW Hsinchu
- Assignee: United Microelectronics Corp.
- Current Assignee: United Microelectronics Corp.
- Current Assignee Address: TW Hsinchu
- Agency: J.C. Patents
- Main IPC: G06F17/50
- IPC: G06F17/50

Abstract:
The invention is directed to a method for checking a die seal ring on a layout. The method comprises steps of receiving a digital database of a layout corresponding to at least a device with a text information corresponding to the layout. Tape-out information corresponding to the layout is received. A checking process is performed according to the digital database of the layout and the tape-out information and, meanwhile, a mask design procedure for designing a mask pattern corresponding to the layout is performed by using the digital database of the layout, the text information and the tape-out information. A result of the checking process is recorded in an inspection table corresponding to the layout.
Public/Granted literature
- US20130326436A1 METHOD FOR CHECKING DIE SEAL RING ON LAYOUT AND COMPUTER SYSTEM Public/Granted day:2013-12-05
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