Invention Grant
US08791709B2 On-chip measurement of capacitance for micro-electro-mechanical system (MEMS) actuator circuit
有权
微机电系统(MEMS)执行器电路的电容片上测量
- Patent Title: On-chip measurement of capacitance for micro-electro-mechanical system (MEMS) actuator circuit
- Patent Title (中): 微机电系统(MEMS)执行器电路的电容片上测量
-
Application No.: US12972596Application Date: 2010-12-20
-
Publication No.: US08791709B2Publication Date: 2014-07-29
- Inventor: Dianbo Guo
- Applicant: Dianbo Guo
- Applicant Address: SG Singapore
- Assignee: STMicroelectronics Asia Pacific Pte Ltd.
- Current Assignee: STMicroelectronics Asia Pacific Pte Ltd.
- Current Assignee Address: SG Singapore
- Main IPC: G01R27/26
- IPC: G01R27/26

Abstract:
A micro-electro-mechanical system (MEMS) actuator circuit and method. The circuit includes a current mirror, a voltage divider having an interior contact and coupled between the mirror output and a potential, an operational amplifier having an input coupled to the interior contact and a switch having input/output contacts separately coupled to the amplifier output and the mirror input and having a switch control. The amplifier output can be coupled to a digital control circuit which can be coupled to the switch control contact and to a digital to analog circuit (DAC) which can be coupled to the digital control circuit and to another amplifier input. An enable signal at the switch control couples the switch input/output contacts together. The capacitance of a MEMS capacitor coupled to the mirror output is determined by measurement of time for the amplifier output to switch from one level to another following a change in DAC output potential.
Public/Granted literature
- US20120153973A1 ON-CHIP MEASUREMENT OF CAPACITANCE FOR MICRO-ELECTRO-MECHANICAL SYSTEM (MEMS) ACTUATOR CIRCUIT Public/Granted day:2012-06-21
Information query