发明授权
- 专利标题： Tracking and characterizing particles with holographic video microscopy
- 专利标题（中）： 用全息影像显微镜跟踪和表征粒子
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申请号： US12740628申请日： 2008-10-30
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公开(公告)号： US08791985B2公开(公告)日： 2014-07-29
- 发明人: David G. Grier , Sang-Hyuk Lee , Fook C. Cheong
- 申请人： David G. Grier , Sang-Hyuk Lee , Fook C. Cheong
- 申请人地址： US NY New York
- 专利权人： New York University
- 当前专利权人： New York University
- 当前专利权人地址： US NY New York
- 代理机构： Foley & Lardner LLP
- 国际申请： PCT/US2008/081794 WO 20081030
- 国际公布： WO2009/059008 WO 20090507
- 主分类号： H04N5/89
- IPC分类号： H04N5/89 ; G03H1/00 ; G01P5/20 ; G01P5/00 ; G01N15/14 ; G01N15/02 ; G03H1/04 ; G03H1/08 ; G01N15/00
摘要：
In-line holography to create images of a specimen, such as one or more particles dispersed in a transparent medium. Analyzing these images with results from light scattering theory yields the particles' sizes with nanometer resolution, their refractive indexes to within one part in a thousand, and their three dimensional positions with nanometer resolution. This procedure can rapidly and directly characterize mechanical, optical and chemical properties of the specimen and its medium.
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