Invention Grant
- Patent Title: Methods and systems for measuring I/O signals
- Patent Title (中): 用于测量I / O信号的方法和系统
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Application No.: US14027464Application Date: 2013-09-16
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Publication No.: US08799703B2Publication Date: 2014-08-05
- Inventor: Simon Brewerton , Patrick Leteinturier , Oreste Bernardi , Antonio Vilela , Klaus Scheibert , Jens Barrenscheen
- Applicant: Infineon Technologies AG
- Applicant Address: DE Neubiberg
- Assignee: Infineon Technologies AG
- Current Assignee: Infineon Technologies AG
- Current Assignee Address: DE Neubiberg
- Agency: Eschweiler & Associates, LLC
- Main IPC: G06F11/00
- IPC: G06F11/00

Abstract:
Some embodiments of the invention relate to an embedded processing system. The system includes a memory unit to store a plurality of operating instructions and a processing unit coupled to the memory unit. The processing unit can execute logical operations corresponding to respective operating instructions. An input/output (I/O) interface receives a first time-varying waveform and provides an I/O signal that is based on the first time-varying waveform. A comparison unit coupled to the processing unit and adapted to selectively assert an error signal based on whether the I/O signal has a predetermined relationship with a reference signal, wherein the predetermined relationship holds true during normal operation but fails to hold true when an unexpected event occurs and causes an unexpected change at least one of the I/O signal and reference signal.
Public/Granted literature
- US20140019805A1 METHODS AND SYSTEMS FOR MEASURING I/O SIGNALS Public/Granted day:2014-01-16
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