Invention Grant
- Patent Title: Test unit for use in a test device and test system
- Patent Title (中): 用于测试设备和测试系统的测试单元
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Application No.: US13292815Application Date: 2011-11-09
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Publication No.: US08814809B2Publication Date: 2014-08-26
- Inventor: Hans List
- Applicant: Hans List
- Applicant Address: US IN Indianapolis
- Assignee: Roche Diagnostics Operations, Inc.
- Current Assignee: Roche Diagnostics Operations, Inc.
- Current Assignee Address: US IN Indianapolis
- Agency: Harness, Dickey
- Priority: EP09159834 20090509
- Main IPC: A61B5/00
- IPC: A61B5/00

Abstract:
The invention concerns a test system comprising a test device which has a lancing drive and an optical measuring device, and at least one test unit that is inserted into the test device as a disposable article, preferably in a magazine. According to the invention it is proposed that the measuring device can be directly coupled to a detection element of the test unit by means of an optics adapter on the device side, where a free end of the spring-loaded optics adapter lies against the detection element in a force-locking manner.
Public/Granted literature
- US20120116250A1 TEST UNIT FOR USE IN A TEST DEVICE AND TEST SYSTEM Public/Granted day:2012-05-10
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