Invention Grant
- Patent Title: Ion energy analyzer and methods of manufacturing the same
- Patent Title (中): 离子能量分析仪及其制造方法
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Application No.: US13433088Application Date: 2012-03-28
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Publication No.: US08816281B2Publication Date: 2014-08-26
- Inventor: Merritt Funk , Lee Chen , Barton Lane , Jianping Zhao , Radha Sundararajan
- Applicant: Merritt Funk , Lee Chen , Barton Lane , Jianping Zhao , Radha Sundararajan
- Applicant Address: JP Tokyo
- Assignee: Tokyo Electron Limited
- Current Assignee: Tokyo Electron Limited
- Current Assignee Address: JP Tokyo
- Agency: Wood, Herron & Evans, LLP
- Main IPC: G01T1/16
- IPC: G01T1/16 ; H01J37/32 ; H05H1/00 ; H01J49/48

Abstract:
A process by which an ion energy analyzer is manufactured includes processing a first substrate to form an entrance grid having a first channel and a first plurality of openings extending therethrough. A second substrate is processed to form a selection grid having a second channel therein and a second plurality of openings extending therethrough. A third substrate is processed to form an ion collector having a third channel therein. The entrance grid is operably coupled to, and electrically isolated from, the selection grid, which is, in turn, operably coupled to, and electrically isolated from, the ion collector.
Public/Granted literature
- US20120248311A1 ION ENERGY ANALYZER AND METHODS OF MANUFACTURING THE SAME Public/Granted day:2012-10-04
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