发明授权
- 专利标题: 3D radiometry
- 专利标题(中): 3D辐射测量
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申请号: US13568546申请日: 2012-08-07
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公开(公告)号: US08818079B2公开(公告)日: 2014-08-26
- 发明人: Long N. Phan , Jonathan Lee Jesneck , Sanjay Sarma
- 申请人: Long N. Phan , Jonathan Lee Jesneck , Sanjay Sarma
- 申请人地址: US MA Cambridge
- 专利权人: Massachusetts Institute of Technology
- 当前专利权人: Massachusetts Institute of Technology
- 当前专利权人地址: US MA Cambridge
- 代理机构: Sunstein Kann Murphy & Timbers LLP
- 主分类号: G06K9/00
- IPC分类号: G06K9/00
摘要:
Methods and a computer program product for deriving temperature information with respect to surfaces within a scene that is imaged radiometrically. A time sequence of radiometric data is acquired in frames viewed from distinct angles. A three-dimensional structure of the scene is derived, allowing viewing angles and distances to the imaged surfaces to be inferred. Normalized surface areas of the imaged surfaces are calculated based on the inferred viewing angles and emissivities of the imaged surfaces are corrected accordingly. Corrections also account for background radiation impinging on the imaged surfaces. The radiometric data are converted to a perceptible temperature map of the imaged surfaces.
公开/授权文献
- US20140044340A1 3D Radiometry 公开/授权日:2014-02-13