Invention Grant
- Patent Title: Inspection apparatus for display substrate
- Patent Title (中): 显示基板检查装置
-
Application No.: US13904302Application Date: 2013-05-29
-
Publication No.: US08830461B2Publication Date: 2014-09-09
- Inventor: Suk Choi , Sujin Kim , Jihong Bae , Heungshik Park , Hyeokjin Lee
- Applicant: Samsung Display Co., Ltd.
- Applicant Address: KR
- Assignee: Samsung Display Co., Ltd.
- Current Assignee: Samsung Display Co., Ltd.
- Current Assignee Address: KR
- Agency: Cantor Colburn LLP
- Priority: KR10-2012-0147516 20121217
- Main IPC: G01J4/00
- IPC: G01J4/00 ; G02F1/1347 ; G02F1/1335

Abstract:
An inspection apparatus for a display substrate includes a reflection plate, a liquid crystal layer, an electrode layer, a ¼ wavelength retardation plate and a polarization plate. The liquid crystal layer is disposed on the reflection plate and includes liquid crystal molecules which have a retardation value of about 140 nanometers to about 200 nanometers and are operated in a twisted nematic mode. The electrode layer is disposed on the liquid crystal layer and generates an electric field in cooperation with an electrode of the display substrate. The ¼ wavelength retardation plate is disposed on the electrode layer and the polarization plate is disposed on the ¼ wavelength retardation plate.
Public/Granted literature
- US20140168577A1 INSPECTION APPARATUS FOR DISPLAY SUBSTRATE Public/Granted day:2014-06-19
Information query