Invention Grant
- Patent Title: Scanning electron microscope and a method for imaging a specimen using the same
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Application No.: US14166884Application Date: 2014-01-29
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Publication No.: US08853630B2Publication Date: 2014-10-07
- Inventor: Atsushi Miyamoto , Wataru Nagatomo , Ryoichi Matsuoka , Hidetoshi Morokuma
- Applicant: Hitachi High-Technologies Corporation
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Antonelli, Terry, Stout & Kraus, LLP.
- Priority: JP2006-040125 20060217
- Main IPC: H01J37/00
- IPC: H01J37/00 ; H01J37/26 ; H01J37/28 ; G01N23/20 ; H01J37/21

Abstract:
(1) part or all of the number, coordinates and size/shape and imaging sequence of imaging points each for observation, the imaging position change method and imaging conditions can be calculated automatically from CAD data, (2) a combination of input information and output information for imaging recipe creation can be set arbitrarily, and (3) decision is made of imaging or processing at an arbitrary imaging point as to whether to be successful/unsuccessful and in case a failure is determined, a relief process can be conducted in which the imaging point or imaging sequence is changed.
Public/Granted literature
- US20140145078A1 SCANNING ELECTRON MICROSCOPE AND A METHOD FOR IMAGING A SPECIMEN USING THE SAME Public/Granted day:2014-05-29
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