Invention Grant
US08861296B2 Memory refresh methods, memory section control circuits, and apparatuses
有权
存储器刷新方法,存储器部分控制电路和装置
- Patent Title: Memory refresh methods, memory section control circuits, and apparatuses
- Patent Title (中): 存储器刷新方法,存储器部分控制电路和装置
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Application No.: US14084417Application Date: 2013-11-19
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Publication No.: US08861296B2Publication Date: 2014-10-14
- Inventor: John David Porter , Gi-Hong Kim
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Dorsey & Whitney LLP
- Main IPC: G11C7/00
- IPC: G11C7/00 ; G11C11/402 ; G11C11/408 ; G11C8/08 ; G11C5/14 ; G11C11/406 ; G11C8/10

Abstract:
Apparatuses, memory section control circuits, and methods of refreshing memory are disclosed. An example apparatus includes a plurality of memory sections and a plurality of memory section control circuits. Each memory section control circuit is coupled to a respective one of the plurality of memory sections and includes a plurality of access line drivers, each of which includes a plurality of transistors having common coupled gates. During an operation of the apparatus a first voltage is provided to the commonly coupled gates of the transistors of at least some of the access line drivers of the memory section control circuit coupled to an active memory section and a second voltage is provided to the commonly coupled gates of the transistors of the access line drivers of the memory section control circuit coupled to an inactive memory section control circuit, wherein the first voltage is greater than the second voltage.
Public/Granted literature
- US20140078847A1 MEMORY REFRESH METHODS, MEMORY SECTION CONTROL CIRCUITS, AND APPARATUSES Public/Granted day:2014-03-20
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