Invention Grant
- Patent Title: Displacement detection mechanism and scanning probe microscope using the same
- Patent Title (中): 位移检测机构和扫描探针显微镜使用相同
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Application No.: US13409255Application Date: 2012-03-01
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Publication No.: US08869311B2Publication Date: 2014-10-21
- Inventor: Ryusuke Hirose
- Applicant: Ryusuke Hirose
- Applicant Address: JP
- Assignee: SII NanoTechnology Inc.
- Current Assignee: SII NanoTechnology Inc.
- Current Assignee Address: JP
- Agency: Adams & Wilks
- Priority: JP2011-046806 20110303
- Main IPC: G01Q60/00
- IPC: G01Q60/00 ; G01Q60/30 ; G01Q20/00 ; B82Y35/00

Abstract:
A displacement detection mechanism for a vibrationally driven cantilever includes a vibration frequency detector comprised of an LC resonator that detects a change of capacitance between the cantilever and a sample surface due to a change of vibration of the cantilever, and an F-V converter or an FM demodulator that detects a voltage based on the vibration frequency, whereby displacement of the cantilever can be detected. The displacement detection mechanism can be used in a scanning probe microscope to perform shape measurement and physical property measurement without the presence of light.
Public/Granted literature
- US20120227138A1 DISPLACEMENT DETECTION MECHANISM AND SCANNING PROBE MIRCOSCOPE USING THE SAME Public/Granted day:2012-09-06
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