Invention Grant
- Patent Title: Semiconductor device and method for fabricating the same
- Patent Title (中): 半导体装置及其制造方法
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Application No.: US13445798Application Date: 2012-04-12
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Publication No.: US08872259B2Publication Date: 2014-10-28
- Inventor: Seung Hwan Kim , Jai Hoon Sim
- Applicant: Seung Hwan Kim , Jai Hoon Sim
- Applicant Address: KR Icheon
- Assignee: Hynix Semiconductor Inc.
- Current Assignee: Hynix Semiconductor Inc.
- Current Assignee Address: KR Icheon
- Priority: KR10-2011-0112419 20111031
- Main IPC: H01L29/66
- IPC: H01L29/66 ; H01L27/108 ; H01L27/02

Abstract:
A semiconductor device and a method for fabricating the same are provided to prevent a floating body effect and reduce coupling capacitance between buried bit lines. The semiconductor device comprises a first pillar disposed over a semiconductor substrate and including a vertical channel region, a bit line located in the lower portion of the vertical channel region inside the first pillar and a semiconductor layer extended from the semiconductor substrate to one sidewall of the first pillar.
Public/Granted literature
- US20130105872A1 SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME Public/Granted day:2013-05-02
Information query
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