发明授权
US08873066B2 System and method for improved resolution, higher scan speeds and reduced processing time in scans involving swept-wavelength interferometry
有权
用于改进分辨率的系统和方法，更高的扫描速度和减少扫描涉及扫频波长干涉测量的处理时间
- 专利标题： System and method for improved resolution, higher scan speeds and reduced processing time in scans involving swept-wavelength interferometry
- 专利标题（中）： 用于改进分辨率的系统和方法，更高的扫描速度和减少扫描涉及扫频波长干涉测量的处理时间
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申请号： US13182780申请日： 2011-07-14
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公开(公告)号： US08873066B2公开(公告)日： 2014-10-28
- 发明人: Jason Ensher , Michael Minneman , Michael Crawford
- 申请人： Jason Ensher , Michael Minneman , Michael Crawford
- 申请人地址： US CO Lafayette
- 专利权人： Insight Photonic Solutions, Inc.
- 当前专利权人： Insight Photonic Solutions, Inc.
- 当前专利权人地址： US CO Lafayette
- 代理机构： Renner, Otto, Boisselle & Sklar, LLP.
- 主分类号： G01B11/02
- IPC分类号： G01B11/02 ; G01B9/02
摘要：
A system and method for measuring an interferometric signal from a swept-wavelength interferometer by scanning a tunable laser source over two wavelength ranges, whose centers are separated substantially more than the length of wavelength ranges. The spatial resolution of the measurement is determined by the inverse of the wavelength separation between a first and second wavelength region, as well as by the wavelength range of the first and second regions. An electronically tunable laser may be utilized to produce two wavelength ranges that are widely separated in wavelength. Such a system and method has wide applications to the fields of optical frequency domain reflectometry (OFDR) and swept-wavelength optical coherence tomography (OCT), for example.
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