Invention Grant
- Patent Title: Select gate programming in a memory device
- Patent Title (中): 在存储设备中选择门编程
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Application No.: US14018926Application Date: 2013-09-05
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Publication No.: US08873297B2Publication Date: 2014-10-28
- Inventor: Shigekazu Yamada , Aaron Yip
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Dicke, Billig & Czaja, PLLC
- Main IPC: G11C11/34
- IPC: G11C11/34 ; G11C16/10 ; G11C16/04 ; G11C16/24 ; G11C16/34

Abstract:
Methods for programming select gates, memory devices, and memory systems are disclosed. In one such method for programming, a program inhibit voltage is transferred from a source to unselected bit lines. Bit line-to-bit line capacitance, between the unselected bit lines and selected bit lines to be program inhibited, boosts the bit line voltage of the selected, inhibited bit lines to a target inhibit voltage. In one embodiment, the voltage on the selected, inhibited bit line can be increased in a plurality of inhibit steps whereby either one, two, or all of the steps can be used during the programming of unprogrammed select gates.
Public/Granted literature
- US20140003151A1 SELECT GATE PROGRAMMING IN A MEMORY DEVICE Public/Granted day:2014-01-02
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