发明授权
- 专利标题: Silicon substrate fabrication
- 专利标题(中): 硅衬底制造
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申请号: US13860557申请日: 2013-04-11
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公开(公告)号: US08877605B1公开(公告)日: 2014-11-04
- 发明人: Yonglin Xie , Carolyn R. Ellinger , Mark D. Evans , Joseph Jech, Jr.
- 申请人: Yonglin Xie , Carolyn R. Ellinger , Mark D. Evans , Joseph Jech, Jr.
- 申请人地址: US NY Rochester
- 专利权人: Eastman Kodak Company
- 当前专利权人: Eastman Kodak Company
- 当前专利权人地址: US NY Rochester
- 代理商 William R. Zimmerli
- 主分类号: H01L21/76
- IPC分类号: H01L21/76 ; B41J2/16
摘要:
A method of etching a silicon substrate includes providing a silicon substrate including a first surface and a second surface. A plurality of grooves spaced apart from each other are etched from the first surface of the silicon substrate. A dielectric material is deposited on the first surface of the silicon substrate and into the plurality of grooves. A hole through the silicon substrate is etched from the second surface of the substrate to the dielectric material. A portion of the hole is located between the plurality of grooves.
公开/授权文献
- US20140308765A1 SILICON SUBSTRATE FABRICATION 公开/授权日:2014-10-16