Invention Grant
US08885794B2 X-ray tomographic inspection system for the identification of specific target items
有权
用于识别特定目标物品的X射线断层摄影检查系统
- Patent Title: X-ray tomographic inspection system for the identification of specific target items
- Patent Title (中): 用于识别特定目标物品的X射线断层摄影检查系统
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Application No.: US13870407Application Date: 2013-04-25
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Publication No.: US08885794B2Publication Date: 2014-11-11
- Inventor: Edward James Morton
- Applicant: Rapiscan Systems, Inc.
- Applicant Address: US CA Torrance
- Assignee: Rapiscan Systems, Inc.
- Current Assignee: Rapiscan Systems, Inc.
- Current Assignee Address: US CA Torrance
- Agency: Novel IP
- Priority: GB0309371.3 20030425; GB0309374.7 20030425; GB0309379.6 20030425; GB0309383.8 20030425; GB0309385.3 20030425; GB0309387.9 20030425; GB0525593.0 20051216; GB0812864.7 20080715; GB0903198.0 20090225
- Main IPC: G01N23/04
- IPC: G01N23/04 ; G01V5/00 ; H01J35/04 ; A61B6/00 ; A61B6/02 ; A61B6/03
Abstract:
The present invention provides for an improved scanning process with a stationary X-ray source arranged to generate X-rays from a plurality of X-ray source positions around a scanning region, a first set of detectors arranged to detect X-rays transmitted through the scanning region, and at least one processor arranged to process outputs from the first set of detectors to generate tomographic image data. The X-ray screening system is used in combination with other screening technologies, such as NQR-based screening, X-ray diffraction based screening, X-ray back-scatter based screening, or Trace Detection based screening.
Public/Granted literature
- US20130336447A1 X-ray Tomographic Inspection System for the Identification of Specific Target Items Public/Granted day:2013-12-19
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