发明授权
- 专利标题： Low cost error-based program testing apparatus and method
- 专利标题（中）： 低成本的基于错误的程序测试仪器和方法
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申请号： US13550118申请日： 2012-07-16
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公开(公告)号： US08886999B2公开(公告)日： 2014-11-11
- 发明人: Yu-Seung Ma , Seon-Tae Kim
- 申请人： Yu-Seung Ma , Seon-Tae Kim
- 申请人地址： KR Daejeon
- 专利权人： Electronics and Telecommunications Research Institute
- 当前专利权人： Electronics and Telecommunications Research Institute
- 当前专利权人地址： KR Daejeon
- 代理机构： Staas & Halsey LLP
- 优先权： KR10-2011-0085323 20110825
- 主分类号： G06F11/00
- IPC分类号： G06F11/00 ; G06F11/263
摘要：
A low cost error-based program testing apparatus and method are provided. The testing apparatus according to an embodiment of the present invention generates error programs by adding errors to a test target program, selects a test target error program associated with test data among the error programs using error information obtained through the error addition, receives the test data to execute the test target error program, and tests for presence/absence of the errors. Accordingly, it is possible to reduce a text execution time and testing costs.
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