发明授权
- 专利标题: Variable resistive memory device
- 专利标题(中): 可变电阻式存储器件
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申请号: US13753712申请日: 2013-01-30
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公开(公告)号: US08901526B2公开(公告)日: 2014-12-02
- 发明人: Ki-hyung Nam , Yong-kwan Kim , Ho-joong Lee , Pulunsol Cho
- 申请人: Ki-hyung Nam , Yong-kwan Kim , Ho-joong Lee , Pulunsol Cho
- 申请人地址: KR Gyeonggi-do
- 专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人地址: KR Gyeonggi-do
- 代理机构: Harness, Dickey & Pierce, P.L.C.
- 优先权: KR10-2012-0020401 20120228
- 主分类号: H01L29/00
- IPC分类号: H01L29/00 ; H01L45/00 ; H01L27/22
摘要:
A variable resistive memory device capable of reducing contact resistance by including a contact layer having low contact resistance, the variable resistive memory device including a substrate comprising an active region; a gate line on the substrate; a first contact layer electrically connected to the active region; a memory cell contact plug electrically connected to the first contact layer; and a variable resistive memory cell electrically connected to the memory cell contact plug, wherein the first contact layer has less contact resistance with respect to the active region than the memory cell contact plug.
公开/授权文献
- US20130221306A1 VARIABLE RESISTIVE MEMORY DEVICE 公开/授权日:2013-08-29
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