Invention Grant
- Patent Title: FinFETs with multiple threshold voltages
- Patent Title (中): 具有多个阈值电压的FinFET
-
Application No.: US13328936Application Date: 2011-12-16
-
Publication No.: US08907431B2Publication Date: 2014-12-09
- Inventor: Po-Chin Kuo , Hsien-Ming Lee
- Applicant: Po-Chin Kuo , Hsien-Ming Lee
- Applicant Address: TW Hsin-Chu
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW Hsin-Chu
- Agency: Slater & Matsil, L.L.P.
- Main IPC: H01L29/78
- IPC: H01L29/78

Abstract:
A device includes a substrate, a semiconductor fin over the substrate, and a gate dielectric layer on a top surface and sidewalls of the semiconductor fin. A gate electrode is spaced apart from the semiconductor fin by the gate dielectric layer. The gate electrode includes a top portion over and aligned to the semiconductor fin, and a sidewall portion on a sidewall portion of the dielectric layer. The top portion of the gate electrode has a first work function, and the sidewall portion of the gate electrode has a second work function different from the first work function.
Public/Granted literature
- US20130154002A1 FinFETs with Multiple Threshold Voltages Public/Granted day:2013-06-20
Information query
IPC分类: