发明授权
- 专利标题： Semiconductor apparatus transmitting fuse information and repair method thereof
- 专利标题（中）： 发送熔丝信息的半导体装置及其修理方法
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申请号： US13168241申请日： 2011-06-24
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公开(公告)号： US08917569B2公开(公告)日： 2014-12-23
- 发明人: Min Seok Choi , Jong Chern Lee
- 申请人： Min Seok Choi , Jong Chern Lee
- 申请人地址： KR Gyeonggi-do
- 专利权人： SK Hynix Inc.
- 当前专利权人： SK Hynix Inc.
- 当前专利权人地址： KR Gyeonggi-do
- 代理机构： William Park & Associates Patent Ltd.
- 优先权： KR10-2011-0009808 20110131
- 主分类号： G11C7/00
- IPC分类号： G11C7/00 ; G11C17/18
摘要：
A semiconductor apparatus includes a signal transmission block and signal reception blocks. The signal transmission block is disposed in a first chip and configured to transmit fuse information in synchronization with transmission control signals. The signal reception blocks are respectively disposed in the first chip and a second chip and configured to receive the fuse information in synchronization with reception control signals.
公开/授权文献
- US20120194243A1 SEMICONDUCTOR APPARATUS AND REPAIR METHOD THEREOF 公开/授权日：2012-08-02
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