发明授权
- 专利标题: Embedded force measurement
- 专利标题(中): 嵌入力测量
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申请号: US13306554申请日: 2011-11-29
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公开(公告)号: US08922523B2公开(公告)日: 2014-12-30
- 发明人: Stephen Brian Lynch , Benjamin Mark Rappoport , Fletcher R. Rothkopf , Paul Stephen Drzaic , Scott Andrew Myers
- 申请人: Stephen Brian Lynch , Benjamin Mark Rappoport , Fletcher R. Rothkopf , Paul Stephen Drzaic , Scott Andrew Myers
- 申请人地址: US CA Cupertino
- 专利权人: Apple Inc.
- 当前专利权人: Apple Inc.
- 当前专利权人地址: US CA Cupertino
- 代理商 Michael H. Lyons
- 主分类号: G06F3/045
- IPC分类号: G06F3/045
摘要:
Disclosed embodiments relate to a force detection system that detects force exerted on a flexible display based upon changes in resistance and/or capacitance. In one embodiment, a method includes measuring a baseline comprising a baseline resistance or a baseline capacitance or both of a force measurement layer disposed within or overlaid on the display panel. The method further includes detecting a change in the baseline resistance or the baseline capacitance or both and calculating a change location where the change in the baseline resistance or the baseline capacitance or both occurred. The method also includes calculating a magnitude of the change in the baseline resistance or the baseline capacitance or both.
公开/授权文献
- US20130135244A1 EMBEDDED FORCE MEASUREMENT 公开/授权日:2013-05-30
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