发明授权
- 专利标题: No-touch stress testing of memory I/O interfaces
- 专利标题(中): 内存I / O接口的无接触压力测试
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申请号: US13536372申请日: 2012-06-28
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公开(公告)号: US08924786B2公开(公告)日: 2014-12-30
- 发明人: Sankaran M. Menon , Robert R. Roeder
- 申请人: Sankaran M. Menon , Robert R. Roeder
- 申请人地址: US CA Santa Clara
- 专利权人: Intel Corporation
- 当前专利权人: Intel Corporation
- 当前专利权人地址: US CA Santa Clara
- 代理机构: Blakely, Sokoloff, Taylor & Zafman LLP
- 主分类号: G06F11/00
- IPC分类号: G06F11/00
摘要:
Embodiments are generally directed no-touch stress testing of memory input/output (I/O) interfaces. An embodiment of a memory device includes a system element to be coupled with a dynamic random-access memory (DRAM), the system element including a memory interface for connection with the DRAM, the interface including a driver and a receiver, a memory controller for control of the DRAM, and a timing stress testing logic for testing of the I/O interface.
公开/授权文献
- US20140006864A1 NO-TOUCH STRESS TESTING OF MEMORY I/O INTERFACES 公开/授权日:2014-01-02
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