发明授权
- 专利标题: Automatic analysis device
- 专利标题(中): 自动分析装置
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申请号: US13129812申请日: 2009-11-12
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公开(公告)号: US08936754B2公开(公告)日: 2015-01-20
- 发明人: Isao Yamazaki , Hiroaki Ishizawa , Sakuichiro Adachi
- 申请人: Isao Yamazaki , Hiroaki Ishizawa , Sakuichiro Adachi
- 申请人地址: JP Tokyo
- 专利权人: Hitachi High-Technologies Corporation
- 当前专利权人: Hitachi High-Technologies Corporation
- 当前专利权人地址: JP Tokyo
- 代理机构: Miles & Stockbridge P.C.
- 优先权: JP2008-293544 20081117
- 国际申请: PCT/JP2009/069291 WO 20091112
- 国际公布: WO2010/055890 WO 20100520
- 主分类号: G01N21/31
- IPC分类号: G01N21/31 ; G01N21/27 ; G01N21/17 ; G01N21/62 ; G01N21/82 ; G01N35/02
摘要:
There is provided a high-accuracy automatic analysis device achieving both of measurement in a wide concentration range and high sensitivity at a low concentration. The signals of a plurality of wavelengths λ1 to λ12 where the sensitivity of light absorption caused by fine particles is high from a light source 40 are converted to absorbances by a spectroscopic optical system (detector) 41. The absorbances are converted to a secondary parameter from in which a noise component is cancelled by using a previously-defined conversion table 54, so that a concentration of a measured material (predetermined component) is calculated by an operation unit (calculating means) 53 based on the secondary parameter. Thus, analysis being resistant to the noise even at the low concentration can be achieved in a range up to a high concentration.
公开/授权文献
- US20110223066A1 AUTOMATIC ANALYSIS DEVICE 公开/授权日:2011-09-15
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