发明授权
US08942047B2 Bit line current trip point modulation for reading nonvolatile storage elements
有权
用于读取非易失性存储元件的位线电流跳变点调制
- 专利标题: Bit line current trip point modulation for reading nonvolatile storage elements
- 专利标题(中): 用于读取非易失性存储元件的位线电流跳变点调制
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申请号: US14290891申请日: 2014-05-29
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公开(公告)号: US08942047B2公开(公告)日: 2015-01-27
- 发明人: Man L. Mui , Teruhiko Kamei , Yingda Dong , Ken Oowada , Yosuke Kato , Fumitoshi Ito , Seungpil Lee
- 申请人: Sandisk Technologies Inc.
- 申请人地址: US TX Plano
- 专利权人: Sandisk Technologies Inc.
- 当前专利权人: Sandisk Technologies Inc.
- 当前专利权人地址: US TX Plano
- 代理机构: Vierra Magen Marcus LLP
- 主分类号: G11C16/06
- IPC分类号: G11C16/06 ; G11C16/28 ; G11C11/56 ; G11C16/26
摘要:
Upon selecting non-volatile storage elements to be sensed, the system obtains information about the position of these non-volatile storage elements, determines sensing parameters based at least in part on this information, pre-charges a charge storage device and, while maintaining the voltage level of the bit lines of these memory cells at a constant value, applies a reference signal to these non-volatile storage elements for a certain duration of time, afterwards determining whether, for the certain duration of time, the current conducted by these non-volatile storage elements exceeds a predetermined value.
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