Invention Grant
US08942949B2 Apparatus and method for determining a state parameter of an object to be monitored
有权
用于确定待监测对象的状态参数的装置和方法
- Patent Title: Apparatus and method for determining a state parameter of an object to be monitored
- Patent Title (中): 用于确定待监测对象的状态参数的装置和方法
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Application No.: US11935951Application Date: 2007-11-06
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Publication No.: US08942949B2Publication Date: 2015-01-27
- Inventor: Dirk Hammerschmidt
- Applicant: Dirk Hammerschmidt
- Applicant Address: DE Neubiberg
- Assignee: Infineon Technologies AG
- Current Assignee: Infineon Technologies AG
- Current Assignee Address: DE Neubiberg
- Agency: Eschweiler & Associates, LLC
- Priority: DE102004010665 20040304
- Main IPC: G01L7/00
- IPC: G01L7/00 ; G01P15/00 ; B60C23/04

Abstract:
An apparatus for determining a state parameter of an object to be monitored includes a means for providing a plurality of measurement values, wherein the measurement values include information relating to the state parameter of the object to be monitored, a comparison means for comparing the measurement value to a predeterminable comparison parameter, wherein the comparison means is formed to output a first comparison signal when a predeterminable number of measurement values falls below the comparison parameter within a measurement interval, or to output a second comparison signal when the predeterminable number of measurement values exceeds or reaches the comparison parameter, wherein the first comparison signal or the second comparison signal indicate the state parameter.
Public/Granted literature
- US20080062004A1 APPARATUS AND METHOD FOR DETERMINING A STATE PARAMETER OF AN OBJECT TO BE MONITORED Public/Granted day:2008-03-13
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