发明授权
- 专利标题: Methods for modeling tunable radio-frequency elements
- 专利标题(中): 可调谐射频元件建模方法
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申请号: US13466017申请日: 2012-05-07
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公开(公告)号: US08947113B2公开(公告)日: 2015-02-03
- 发明人: Liang Han , Jayesh Nath , Matthew A. Mow , Peter Bevelacqua , Joshua G. Nickel , Mattia Pascolini , Robert W. Schlub , Ruben Caballero
- 申请人: Liang Han , Jayesh Nath , Matthew A. Mow , Peter Bevelacqua , Joshua G. Nickel , Mattia Pascolini , Robert W. Schlub , Ruben Caballero
- 申请人地址: US CA Cupertino
- 专利权人: Apple Inc.
- 当前专利权人: Apple Inc.
- 当前专利权人地址: US CA Cupertino
- 代理机构: Treyz Law Group
- 代理商 Jason Tsai; Michael H. Lyons
- 主分类号: G01R31/00
- IPC分类号: G01R31/00
摘要:
A test system for characterizing an antenna tuning element is provided. The test system may include a test host, a radio-frequency tester, and a test fixture. The test system may calibrate the radio-frequency tester using known coaxial standards. The test system may then calibrate transmission line effects associated with the test fixture using a THRU-REFLECT-LINE calibration algorithm. The antenna tuning element may be mounted on a test socket that is part of the test fixture. While the antenna tuning element is mounted on the test socket, scattering parameter measurements may be obtained using the radio-frequency tester. An equivalent circuit model for the test socket can be obtained based on the measured scattering parameters and known characteristics of the antenna tuning element. Once the test socket has been characterized, an equivalent circuit model for the antenna tuning element can be obtained by extracting suitable modeling parameters from the measured scattering parameters.
公开/授权文献
- US20130293249A1 Methods for Modeling Tunable Radio-Frequency Elements 公开/授权日:2013-11-07