Invention Grant
- Patent Title: Apolarized interferometric system, and apolarized interferometric measurement method
- Patent Title (中): 非极化干涉测量系统和非极化干涉测量方法
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Application No.: US13882800Application Date: 2011-11-02
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Publication No.: US08953169B2Publication Date: 2015-02-10
- Inventor: Herve Lefevre , Cedric Molucon , Jean-Jacques Bonnefois , Karl Aubry
- Applicant: Herve Lefevre , Cedric Molucon , Jean-Jacques Bonnefois , Karl Aubry
- Applicant Address: FR Marly le Roi
- Assignee: Ixblue
- Current Assignee: Ixblue
- Current Assignee Address: FR Marly le Roi
- Agency: Young & Thompson
- Priority: FR1059050 20101103
- International Application: PCT/FR2011/052561 WO 20111102
- International Announcement: WO2012/059690 WO 20120510
- Main IPC: G01B9/02
- IPC: G01B9/02 ; G01J9/02

Abstract:
An interferometric system includes a polarization separation element (10), a first polarization conversion element (11), a Mach-Zehnder interferometer (2) including a first (4) and second (5) arms connected to one another by a first (6) and second (7) ends in order for a first and second beams (20, 21) having the same polarization to pass through the interferometer in a reciprocal manner in opposite directions of propagation, respectively, so as to form a first and second interferometric beam (22, 23), a second polarization conversion element (11) for obtaining an interferometric beam (24), the polarization of which is converted, a polarization-combining element (10), and a detection element (8) suitable for detecting an output beam (25).
Public/Granted literature
- US20130222810A1 APOLARIZED INTERFEROMETRIC SYSTEM, AND APOLARIZED INTERFEROMETRIC MEASUREMENT METHOD Public/Granted day:2013-08-29
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