发明授权
- 专利标题: Solid-state image pickup apparatus and X-ray inspection system
- 专利标题(中): 固态摄像装置和X光检查系统
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申请号: US14048710申请日: 2013-10-08
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公开(公告)号: US08953745B2公开(公告)日: 2015-02-10
- 发明人: Harumichi Mori , Ryuji Kyushima , Kazuki Fujita
- 申请人: Hamamatsu Photonics K.K.
- 申请人地址: JP Hamamatsu-shi, Shizuoka
- 专利权人: Hamamatsu Photonics K.K.
- 当前专利权人: Hamamatsu Photonics K.K.
- 当前专利权人地址: JP Hamamatsu-shi, Shizuoka
- 代理机构: Drinker Biddle & Reath LLP
- 优先权: JP2008-114214 20080424
- 主分类号: G01N23/04
- IPC分类号: G01N23/04 ; A61B6/03 ; H04N5/32 ; H04N5/345 ; H04N5/347 ; H04N5/353 ; H04N5/3745
摘要:
A solid-state image pickup apparatus 1A includes a photodetecting section 10A and a signal readout section 20 etc. In the photodetecting section 10A, M×N pixel units P1,1 to PM,N are arrayed in M rows and N columns. When in a first imaging mode, a voltage value according to an amount of charges generated in a photodiode of each of the M×N pixel units in the photodetecting section 10A is output from the signal readout section 20. When in a second imaging mode, a voltage value according to an amount of charges generated in the photodiode of each pixel unit included in consecutive M1 rows in the photodetecting section 10A is output from the signal readout section 20. When in the second imaging mode than when in the first imaging mode, the readout pixel pitch in frame data is smaller, the frame rate is higher, and the gain being a ratio of an output voltage value to an input charge amount in the signal readout section 20 is greater.
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