发明授权
- 专利标题: Semiconductor device and method for making the same
- 专利标题(中): 半导体装置及其制造方法
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申请号: US13415959申请日: 2012-03-09
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公开(公告)号: US08956961B2公开(公告)日: 2015-02-17
- 发明人: Kazuaki Takesako , Wen-Kuei Hsu , Yoshinori Tanaka , Yukihiro Nagai , Chih-Wei Hsiung , Hirotake Fujita , Tomohiro Kadoya , Wei-Chih Liu , Hsuan-Yu Fang , Yu-Ling Huang , Meng-Hsien Chen , Chun-Chiao Tseng , Chung-Yung Ai , Yu-Shan Hsu , Wei-Che Chang , Chun-Hua Huang
- 申请人: Kazuaki Takesako , Wen-Kuei Hsu , Yoshinori Tanaka , Yukihiro Nagai , Chih-Wei Hsiung , Hirotake Fujita , Tomohiro Kadoya , Wei-Chih Liu , Hsuan-Yu Fang , Yu-Ling Huang , Meng-Hsien Chen , Chun-Chiao Tseng , Chung-Yung Ai , Yu-Shan Hsu , Wei-Che Chang , Chun-Hua Huang
- 申请人地址: TW Taichung
- 专利权人: Rexchip Electronics Corporation
- 当前专利权人: Rexchip Electronics Corporation
- 当前专利权人地址: TW Taichung
- 代理机构: Occhiuti & Rohlicek LLP
- 主分类号: H01L21/02
- IPC分类号: H01L21/02
摘要:
A semiconductor device includes: a substrate having a base and an array of semiconductor pillars extending from the base, the substrate being formed with a plurality of trenches, each of which extends into the base and has two opposing trench side walls; a first insulative liner layer formed on each of the trench side walls of each of the trenches and divided into upper and lower segments by a gap that leaves a bit-forming surface of each of the trench side walls uncovered by the first insulative liner layer; and a plurality of buried bit lines, each of which extends into the base from the bit-forming surface of a respective one of the trench side walls of each of the trenches.
公开/授权文献
- US20130234230A1 Semiconductor Device and Method for Making the Same 公开/授权日:2013-09-12
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