Invention Grant
- Patent Title: Magnetometer test arrangement and method
- Patent Title (中): 磁力计测试布置和方法
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Application No.: US13032107Application Date: 2011-02-22
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Publication No.: US08963538B2Publication Date: 2015-02-24
- Inventor: Peter T. Jones , David T. Myers , Franklin P. Myers , Jim D. Pak
- Applicant: Peter T. Jones , David T. Myers , Franklin P. Myers , Jim D. Pak
- Applicant Address: US TX Austin
- Assignee: Freescale Semiconductor Inc.
- Current Assignee: Freescale Semiconductor Inc.
- Current Assignee Address: US TX Austin
- Agency: Ingrassia Fisher & Lorenz, P.C.
- Main IPC: G01R35/00
- IPC: G01R35/00 ; G01R33/00 ; G01R31/00 ; G01R31/20

Abstract:
Manufacturing of magnetometer units (20′) employs a test socket (41) having a substantially rigid body (43) with a cavity (42) therein holding an untested unit (20) in a predetermined position (48) proximate electrical connection (50) thereto, wherein one or more magnetic field sources (281, 332, 333, 334, 335, 336) fixed in the body (43) provide known magnetic fields at the position (48) so that the response of each unit (20) is measured and compared to stored expected values. Based thereon, each unit (20) can be calibrated or trimmed by feeding corrective electrical signals back to the unit (20) through the test socket (41) until the actual and expected responses match or the unit (200) is discarded as uncorrectable. In a preferred embodiment, the magnetic field sources (281, 332, 333, 334, 335, 336) are substantially orthogonal coil pairs (332, 333, 334) arranged so that their centerlines (332-1, 333-1, 334-1) coincide at a common point (46) within the predetermined position (48). Because the test-socket (41) is especially rugged and compact, other functions (e.g., accelerometers) included in the unit (20) can also be easily tested and trimmed.
Public/Granted literature
- US20120210562A1 MAGNETOMETER TEST ARRANGEMENT AND METHOD Public/Granted day:2012-08-23
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