Invention Grant
- Patent Title: Specimen preparation for transmission electron microscopy
- Patent Title (中): 透射电子显微镜样品制备
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Application No.: US13544019Application Date: 2012-07-09
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Publication No.: US08969827B2Publication Date: 2015-03-03
- Inventor: Yong-Fen Hsieh , Chih-Hsun Chu , Pradeep Sharma , Yu-Feng Ko , Chung-Shi Yang , Lin-Ai Tai , Yu-Ching Chen
- Applicant: Yong-Fen Hsieh , Chih-Hsun Chu , Pradeep Sharma , Yu-Feng Ko , Chung-Shi Yang , Lin-Ai Tai , Yu-Ching Chen
- Applicant Address: US CA San Jose TW Miaoli County
- Assignee: Materials Analysis Technology (US) Corp.,National Health Research Institutes
- Current Assignee: Materials Analysis Technology (US) Corp.,National Health Research Institutes
- Current Assignee Address: US CA San Jose TW Miaoli County
- Agency: Intellectual Property Connections, Inc.
- Agent Hsiu-Ming Saunders
- Main IPC: B82Y35/00
- IPC: B82Y35/00 ; G01N1/40 ; G01N23/02 ; G01N33/49

Abstract:
A specimen kit having a tiny chamber is disclosed for a specimen preparation for TEM. The space height of the chamber is far smaller than dimensions of blood cells and therefore is adapted to sort nanoparticles from the blood cells. The specimen prepared under this invention is suitable for TEM observation over a true distribution status of nanoparticles in blood. The extremely tiny space height in Z direction eliminates the possibility of aggregation of the nanoparticles and/or agglomeration in Z direction during drying; therefore, a specimen prepared under this invention is suitable for TEM observation over the dispersion and/or agglomeration of nanoparticles in a blood.
Public/Granted literature
- US20140007709A1 SPECIMEN PREPARATION FOR TEM Public/Granted day:2014-01-09
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