Invention Grant
- Patent Title: Process for forming semiconductor structure
- Patent Title (中): 半导体结构形成工艺
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Application No.: US13370477Application Date: 2012-02-10
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Publication No.: US08975183B2Publication Date: 2015-03-10
- Inventor: Jing-Cheng Lin
- Applicant: Jing-Cheng Lin
- Applicant Address: TW Hsin-Chu
- Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee Address: TW Hsin-Chu
- Agency: Duane Morris LLP
- Main IPC: H01L21/44
- IPC: H01L21/44

Abstract:
A method for forming a semiconductor structure. A semiconductor substrate including a plurality of dies mounted thereon is provided. The substrate includes a first portion proximate to the dies and a second portion distal to the dies. In some embodiments, the first portion may include front side metallization. The second portion of the substrate is thinned and a plurality of conductive through substrate vias (TSVs) is formed in the second portion of the substrate after the thinning operation. Prior to thinning, the second portion may not contain metallization. In one embodiment, the substrate may be a silicon interposer. Further back side metallization may be formed to electrically connect the TSVs to other packaging substrates or printed circuit boards.
Public/Granted literature
- US20130210198A1 PROCESS FOR FORMING SEMICONDUCTOR STRUCTURE Public/Granted day:2013-08-15
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