发明授权
- 专利标题: Polishing apparatus and polishing method
- 专利标题(中): 抛光设备和抛光方法
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申请号: US13308857申请日: 2011-12-01
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公开(公告)号: US08979615B2公开(公告)日: 2015-03-17
- 发明人: Masaya Seki , Tetsuji Togawa , Masayuki Nakanishi , Naoki Matsuda , Atsushi Yoshida
- 申请人: Masaya Seki , Tetsuji Togawa , Masayuki Nakanishi , Naoki Matsuda , Atsushi Yoshida
- 申请人地址: JP Tokyo
- 专利权人: Ebara Corporation
- 当前专利权人: Ebara Corporation
- 当前专利权人地址: JP Tokyo
- 代理机构: Wenderoth, Lind & Ponack, L.L.P.
- 优先权: JP2011-067211 20110325; JP2011-247228 20111111
- 主分类号: B24B21/04
- IPC分类号: B24B21/04 ; B24B9/06 ; B24B21/00
摘要:
The polishing apparatus has a polishing unit capable of polishing a peripheral portion of the substrate to form a right-angled cross section. The polishing apparatus includes: a substrate holder that holds and rotates the substrate; guide rollers that support a polishing tape; and a polishing head having a pressing member that presses an edge of the polishing tape against the peripheral portion of the substrate from above. The guide rollers are arranged such that the polishing tape extends parallel to a tangential direction of the substrate and a polishing surface of the polishing tape is parallel to a surface of the substrate. The substrate holder includes: a holding stage that holds the substrate; and a supporting stage that supports a lower surface of the peripheral portion of the substrate in its entirety. The supporting stage rotates in unison with the holding stage.
公开/授权文献
- US20120244787A1 POLISHING APPARATUS AND POLISHING METHOD 公开/授权日:2012-09-27
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