Methods and test equipment for measuring jitter in a Pulse Amplitude Modulated (PAM) transmitter. Under one procedure, a first two-level PAM signal test pattern is used to measure clock-related jitter separated into random and deterministic components, while a second two-level PAM signal test pattern is used to measure oven-odd jitter (EOJ). Under another procedure, A four-level PAM signal test pattern is used to measure jitter-induced noise using distortion analysis. Test equipment are also disclosed for implementing various aspects of the test methods.