发明授权
- 专利标题: System and method of measuring a sensor offset
- 专利标题(中): 测量传感器偏移的系统和方法
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申请号: US12895924申请日: 2010-10-01
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公开(公告)号: US08983788B2公开(公告)日: 2015-03-17
- 发明人: Wei D. Wang , Steven E. Schulz , Jeffrey David , Jackie L Cui , Andrew M. Zettel , Hanne Buur
- 申请人: Wei D. Wang , Steven E. Schulz , Jeffrey David , Jackie L Cui , Andrew M. Zettel , Hanne Buur
- 申请人地址: US MI Detroit
- 专利权人: GM Global Technology Operations LLC
- 当前专利权人: GM Global Technology Operations LLC
- 当前专利权人地址: US MI Detroit
- 代理机构: Quinn Law Group, PLLC
- 主分类号: G01D18/00
- IPC分类号: G01D18/00
摘要:
A method includes detecting a first event and executing a first procedure to identify a sensor offset in response to detecting the first event. The method further includes determining, via a computing device, whether the sensor offset was measured during the execution of the first procedure, scheduling a second procedure to execute in response to detecting a second event if the sensor offset was not measured during the first procedure, and scheduling the first procedure to execute in response to detecting a subsequent occurrence of the first event if the sensor offset was measured during the first procedure.
公开/授权文献
- US20120084039A1 SYSTEM AND METHOD OF MEASURING A SENSOR OFFSET 公开/授权日:2012-04-05
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